ROSSONI, ANGELO
 Distribuzione geografica
Continente #
AS - Asia 112
NA - Nord America 97
EU - Europa 73
SA - Sud America 23
AF - Africa 3
Totale 308
Nazione #
US - Stati Uniti d'America 91
IT - Italia 59
SG - Singapore 35
CN - Cina 28
BD - Bangladesh 17
BR - Brasile 15
VN - Vietnam 11
HK - Hong Kong 6
FR - Francia 5
TW - Taiwan 5
IN - India 4
AR - Argentina 3
CA - Canada 3
DE - Germania 3
GB - Regno Unito 2
MY - Malesia 2
NL - Olanda 2
PY - Paraguay 2
UZ - Uzbekistan 2
VE - Venezuela 2
ZA - Sudafrica 2
AT - Austria 1
BW - Botswana 1
EC - Ecuador 1
ES - Italia 1
JM - Giamaica 1
KR - Corea 1
MM - Myanmar 1
MX - Messico 1
TT - Trinidad e Tobago 1
Totale 308
Città #
Dallas 29
Brescia 26
Singapore 19
Calcinate 7
Milan 7
San Jose 7
The Dalles 7
Ashburn 6
Beijing 6
Ho Chi Minh City 6
Hong Kong 6
Lauterbourg 5
Redondo Beach 4
Hsinchu 3
Los Angeles 3
New York 3
Pisogne 3
Quận Một 3
Buffalo 2
Chennai 2
Denver 2
Fernando de la Mora 2
Kuala Lumpur 2
Orem 2
Ospitaletto 2
São Paulo 2
Tashkent 2
Verona 2
Albany 1
Amsterdam 1
Barão de Cocais 1
Belo Horizonte 1
Bengaluru 1
Berazategui 1
Bergamo 1
Bismarck 1
Bricktown 1
Cachoeiras de Macacu 1
Cape Town 1
Casnate Con Bernate 1
Catania 1
Caxambu 1
Chicago 1
Ciudad Guayana 1
Cosenza 1
Council Bluffs 1
Detroit 1
Dongguan 1
Elizabeth 1
Ennerdale 1
Fazenda Rio Grande 1
Frankfurt am Main 1
Gaborone 1
Getafe 1
Goiatuba 1
Guangzhou 1
Guayaquil 1
Hải Dương 1
Las Vegas 1
London 1
Macaíba 1
Manchester 1
Maple Grove 1
Maracaibo 1
Messina 1
Montesilvano Marina 1
Montreal 1
Mumbai 1
Myitkyina 1
Noicattaro 1
North York 1
Ocean Isle Beach 1
Paulínia 1
Phoenix 1
Port of Spain 1
Resistencia 1
Rio de Janeiro 1
Rome 1
Salem 1
Salta 1
Salto 1
San Antonio 1
San Francisco 1
Santa Clara 1
Shanghai 1
Shanwei 1
Shijiazhuang 1
Simão Dias 1
Taipei 1
Tampa 1
Uberlândia 1
Val-d'Or 1
Viana 1
Vienna 1
Westville 1
Xalapa 1
Xi'an 1
Zhubei 1
Totale 240
Nome #
Modeling Stress Effects from Fin Isolation in 7nm FinFET Transistors 78
Stress-related Local Layout Effects in FinFET Technology and Device Design Sensitivity 67
Impact of the Inter-Fin Space on Stress Modulation and FinFET Transistor Performance 44
Layout experiments and test structures to characterize Local Layout Effects due to mechanical stress in FinFET transistors 42
Impact of the Gate and Fin Space Variation on Stress Modulation and FinFET Transistor Performance 37
Stress-Related Local Layout Effects in FinFET Technology and Device Design Sensitivity 33
Impact of Process Variation on Parametric Performance of FinFET Transistors – Stress-aware Variability Control 17
Totale 318
Categoria #
all - tutte 1.208
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 1.208


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2024/202552 0 0 0 0 22 2 3 4 5 4 6 6
2025/2026259 5 25 48 25 18 11 36 13 10 25 28 15
2026/20277 7 0 0 0 0 0 0 0 0 0 0 0
Totale 318