ROSSONI, ANGELO
 Distribuzione geografica
Continente #
AS - Asia 97
NA - Nord America 83
EU - Europa 63
SA - Sud America 23
AF - Africa 3
Totale 269
Nazione #
US - Stati Uniti d'America 80
IT - Italia 49
SG - Singapore 35
CN - Cina 27
BR - Brasile 15
VN - Vietnam 11
HK - Hong Kong 6
FR - Francia 5
TW - Taiwan 5
IN - India 4
AR - Argentina 3
BD - Bangladesh 3
DE - Germania 3
GB - Regno Unito 2
MY - Malesia 2
NL - Olanda 2
PY - Paraguay 2
UZ - Uzbekistan 2
VE - Venezuela 2
ZA - Sudafrica 2
AT - Austria 1
BW - Botswana 1
CA - Canada 1
EC - Ecuador 1
ES - Italia 1
KR - Corea 1
MM - Myanmar 1
MX - Messico 1
TT - Trinidad e Tobago 1
Totale 269
Città #
Dallas 28
Brescia 26
Singapore 19
Calcinate 7
San Jose 7
The Dalles 7
Beijing 6
Ho Chi Minh City 6
Hong Kong 6
Ashburn 5
Lauterbourg 5
Milan 5
Redondo Beach 4
Hsinchu 3
New York 3
Pisogne 3
Quận Một 3
Chennai 2
Denver 2
Fernando de la Mora 2
Kuala Lumpur 2
Orem 2
Ospitaletto 2
São Paulo 2
Tashkent 2
Albany 1
Amsterdam 1
Barão de Cocais 1
Belo Horizonte 1
Bengaluru 1
Berazategui 1
Bergamo 1
Bismarck 1
Bricktown 1
Buffalo 1
Cachoeiras de Macacu 1
Cape Town 1
Casnate Con Bernate 1
Catania 1
Caxambu 1
Chicago 1
Ciudad Guayana 1
Council Bluffs 1
Detroit 1
Dongguan 1
Ennerdale 1
Fazenda Rio Grande 1
Frankfurt am Main 1
Gaborone 1
Getafe 1
Goiatuba 1
Guangzhou 1
Guayaquil 1
Hải Dương 1
Las Vegas 1
London 1
Los Angeles 1
Macaíba 1
Manchester 1
Maracaibo 1
Montesilvano Marina 1
Montreal 1
Mumbai 1
Myitkyina 1
Noicattaro 1
Ocean Isle Beach 1
Paulínia 1
Phoenix 1
Port of Spain 1
Resistencia 1
Rio de Janeiro 1
Salem 1
Salta 1
Salto 1
San Antonio 1
San Francisco 1
Shanwei 1
Shijiazhuang 1
Simão Dias 1
Taipei 1
Uberlândia 1
Viana 1
Vienna 1
Xalapa 1
Xi'an 1
Zhubei 1
Totale 220
Nome #
Modeling Stress Effects from Fin Isolation in 7nm FinFET Transistors 75
Stress-related Local Layout Effects in FinFET Technology and Device Design Sensitivity 67
Impact of the Inter-Fin Space on Stress Modulation and FinFET Transistor Performance 44
Layout experiments and test structures to characterize Local Layout Effects due to mechanical stress in FinFET transistors 41
Stress-Related Local Layout Effects in FinFET Technology and Device Design Sensitivity 30
Impact of the Gate and Fin Space Variation on Stress Modulation and FinFET Transistor Performance 16
Impact of Process Variation on Parametric Performance of FinFET Transistors – Stress-aware Variability Control 6
Totale 279
Categoria #
all - tutte 888
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 888


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2024/202552 0 0 0 0 22 2 3 4 5 4 6 6
2025/2026227 5 25 48 25 18 11 36 13 10 25 11 0
Totale 279