ROSSONI, ANGELO
ROSSONI, ANGELO
Dipartimento di Ingegneria dell'Informazione
Impact of the Inter-Fin Space on Stress Modulation and FinFET Transistor Performance
2025-01-01 Rossoni, A.; Brozek, T.; Saxena, S.; Khamankar, R.; Kovacs-Vajna, Z. M.
Layout experiments and test structures to characterize Local Layout Effects due to mechanical stress in FinFET transistors
2025-01-01 Rossoni, A.; Brozek, T.; Saxena, S.; Khamankar, R.; Hess, C.; Huang, J.; Teng, Y.; Kovacs-Vajna, Z.; Quarantelli, M.
Modeling Stress Effects from Fin Isolation in 7nm FinFET Transistors
2024-01-01 Rossoni, Angelo; Kovacs-Vajna, Zsolt M.; Colalongo, Luigi; Khamankar, Rajesh; Saxena, Sharad; Brozek, Tomasz
Stress-related Local Layout Effects in FinFET Technology and Device Design Sensitivity
In corso di stampa Rossoni, Angelo; Brozek, Tomasz; Saxena, Sharad; Khamankar, Rajesh; Colalongo, Luigi; Kovacs-Vajna, Zsolt M.
Stress-Related Local Layout Effects in FinFET Technology and Device Design Sensitivity
2025-01-01 Rossoni, A.; Brozek, T.; Saxena, S.; Khamankar, R.; Colalongo, L.; Kovacs-Vajna, Z. M.
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| Impact of the Inter-Fin Space on Stress Modulation and FinFET Transistor Performance | 1-gen-2025 | Rossoni, A.; Brozek, T.; Saxena, S.; Khamankar, R.; Kovacs-Vajna, Z. M. | |
| Layout experiments and test structures to characterize Local Layout Effects due to mechanical stress in FinFET transistors | 1-gen-2025 | Rossoni, A.; Brozek, T.; Saxena, S.; Khamankar, R.; Hess, C.; Huang, J.; Teng, Y.; Kovacs-Vajna, Z.; Quarantelli, M. | |
| Modeling Stress Effects from Fin Isolation in 7nm FinFET Transistors | 1-gen-2024 | Rossoni, Angelo; Kovacs-Vajna, Zsolt M.; Colalongo, Luigi; Khamankar, Rajesh; Saxena, Sharad; Brozek, Tomasz | |
| Stress-related Local Layout Effects in FinFET Technology and Device Design Sensitivity | In corso di stampa | Rossoni, Angelo; Brozek, Tomasz; Saxena, Sharad; Khamankar, Rajesh; Colalongo, Luigi; Kovacs-Vajna, Zsolt M. | |
| Stress-Related Local Layout Effects in FinFET Technology and Device Design Sensitivity | 1-gen-2025 | Rossoni, A.; Brozek, T.; Saxena, S.; Khamankar, R.; Colalongo, L.; Kovacs-Vajna, Z. M. |