Failures induced on analog integrated circuits by electromagnetic interference (EMI) will be analyzed with particular emphasis on integrated operational amplifiers built with different technologies. Additionally, the correlation found between EMI susceptibility and large-signal opamp behavior will be discussed. Some criteria for the design of low EMI susceptibility opamps will be derived. Finally, as an application example, the design of a BiCMOS opamp with an extremely low-probability EMI-induced failure will be presented. Copyright © 1996 Elsevier Science Ltd.
Failures induced on analog integrated circuits by conveyed electromagnetic interferences: A review
Kovacs Zs. M.
1996-01-01
Abstract
Failures induced on analog integrated circuits by electromagnetic interference (EMI) will be analyzed with particular emphasis on integrated operational amplifiers built with different technologies. Additionally, the correlation found between EMI susceptibility and large-signal opamp behavior will be discussed. Some criteria for the design of low EMI susceptibility opamps will be derived. Finally, as an application example, the design of a BiCMOS opamp with an extremely low-probability EMI-induced failure will be presented. Copyright © 1996 Elsevier Science Ltd.File in questo prodotto:
Non ci sono file associati a questo prodotto.
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
