In this work, comparative studies of the surface morphology and surface chemistry of SnO2 nanolayers prepared by spin coating with subsequent thermal oxidation (SCTO) in the temperature range of 400-700 °C using scanning electron microscopy (SEM), atomic force microscopy (AFM) and x-ray photoelectron spectroscopy (XPS) methods, are presented. The SEM images show that SCTO SnO2 nanolayers contain partly connected irregular structures strongly dependent on the final oxidation temperature, with interconnected single grains of longitudinal shape and size, resulting in a flatter surface morphology with respect to the commonly used three-dimensional (3D) SnO2 thin films. In turn, AFM studies additionally confirm that SCTO SnO2 nanolayers after post-oxidation annealing at higher temperatures contain isolated grains of average lateral dimensions in the range of 20-50 nm having a rather flat surface morphology of average surface roughness defined by the root mean square factor at the level of ∼2 nm. From the XPS experimental research it can be concluded that, for our SCTO SnO2 samples, a slight surface nonstoichiometry defined by the relative [O]/[Sn] concentration at the level of 1.8-1.9 is observed, also depending on the final post-oxidation temperature, being an evident contradiction to recently published literature using x-ray diffraction data. Moreover, XPS experiments show that there is also a permanent small amount of carbon contamination present at the surface of internal grains of our SCTO SnO2 nanolayers, creating an undesired potential barrier for interactions with gaseous species when they are used as the active materials for gas sensing devices.

Surface properties of SnO2 nanolayers prepared by spin-coating and thermal oxidation

Comini E.;
2020-01-01

Abstract

In this work, comparative studies of the surface morphology and surface chemistry of SnO2 nanolayers prepared by spin coating with subsequent thermal oxidation (SCTO) in the temperature range of 400-700 °C using scanning electron microscopy (SEM), atomic force microscopy (AFM) and x-ray photoelectron spectroscopy (XPS) methods, are presented. The SEM images show that SCTO SnO2 nanolayers contain partly connected irregular structures strongly dependent on the final oxidation temperature, with interconnected single grains of longitudinal shape and size, resulting in a flatter surface morphology with respect to the commonly used three-dimensional (3D) SnO2 thin films. In turn, AFM studies additionally confirm that SCTO SnO2 nanolayers after post-oxidation annealing at higher temperatures contain isolated grains of average lateral dimensions in the range of 20-50 nm having a rather flat surface morphology of average surface roughness defined by the root mean square factor at the level of ∼2 nm. From the XPS experimental research it can be concluded that, for our SCTO SnO2 samples, a slight surface nonstoichiometry defined by the relative [O]/[Sn] concentration at the level of 1.8-1.9 is observed, also depending on the final post-oxidation temperature, being an evident contradiction to recently published literature using x-ray diffraction data. Moreover, XPS experiments show that there is also a permanent small amount of carbon contamination present at the surface of internal grains of our SCTO SnO2 nanolayers, creating an undesired potential barrier for interactions with gaseous species when they are used as the active materials for gas sensing devices.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11379/540316
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