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Microstructural Characterization Of Fe-Al Thin-Films

SBERVEGLIERI, Giorgio;
1991-01-01
1991
Nessuno
PE3_5 Electronic properties of materials and transport
THIN SOLID FILMS
sì
2-s2.0-0026238335
WOS:A1991GL26500011
Sì, ma tipo non specificato
Inglese
Internazionale
204
377
384
7
The structural properties of thermally evaporated Al-Fe layers were studied as a function of the aluminium layer thickness delta-Al (taking values of 1, 2 and 4 nm), with an iron layer of constant thickness, delta-Fe = 30 nm. The quality and orientation of the material were examined by X-ray diffraction and transmission electron microscopy. Crystallites of alpha-Fe oriented in the (110) direction were around 7-8 nm in size for any value of delta-Al except near delta-Al = 1 nm where a mostly amorphous iron layer was obtained. It was also verified that a bilayer of composition delta-Al = 2 nm and delta-Fe = 30 nm, twice repeated, led to a two-phase metal system consisting of an amorphous component and crystalline alpha-Fe type material texturized along the (110) direction. The Fe3Al phase was also detected in the bilayer structure with delta-Al = 4 nm.
5
info:eu-repo/semantics/article
262
E., Bonetti; S., Enzo; Sberveglieri, Giorgio; G., Valdre; S., Groppelli
1 Contributo su Rivista::1.1 Articolo in rivista
none
1.1 Articolo in rivista
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11379/34181
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