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Structural Models For Cobalt-Tin Oxide Thin-Films

DEPERO, Laura Eleonora;SBERVEGLIERI, Giorgio
1995-01-01
1995
Nessuno
PE3_5 Electronic properties of materials and transport
JOURNAL OF SOLID STATE CHEMISTRY
sì
2-s2.0-0141672790
WOS:A1995QW21400006
Sì, ma tipo non specificato
Inglese
Internazionale
116
256
264
8
Thin films of ternary compounds with formula Sn1-xCoxOy (0 < x less than or equal to 0.15) were studied by X-ray diffraction. The diffraction patterns from the new compounds with x < 0.20 are similar to those obtained from pure SnO2 thin films. The relationships between rutile (SnO2) and the spinel structure of Co2SnO4 are discussed by describing them in similar unit cells, as obtained by the transformations GRAPHICS respectively. For x = 0.20, a new phase appears, closely related to SnO2. For this new phase all the reflections in the corresponding powder pattern can be indexed with an orthorhombic unit cell, in which the parameters (a = 9.400 Angstrom, b = 9.557 Angstrom, and c = 6.33 Angstrom) are about twice those of SnO2. Different models for this new phase are derived and calculated diffraction patterns are compared with those observed. (C) 1995 Academic Press, Inc.
3
info:eu-repo/semantics/article
262
Depero, Laura Eleonora; P., Levrangi; Sberveglieri, Giorgio
1 Contributo su Rivista::1.1 Articolo in rivista
none
1.1 Articolo in rivista
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11379/34154
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