The main issue concerning metal oxide (MOX) gas sensors is mostly related to the wide range of resistive values that the sensors can show. In addition, some sensors could have baseline resistive values up to tens of gigohms. To avoid the use of expensive picoammeters or the use of circuits adopting scaling factors, different solutions have recently been proposed, exploiting the resistance-to-time conversion (RTC) technique. They show good linearity and are suitable for the integration in a chip together with the elaboration unit, but they may require long measurement time (tens of seconds) if high resistance values need to be estimated. In addition, they may suffer the influence of a sensor parasitic capacitance, in parallel with the resistive component. In this paper, a new method is proposed to reduce the measuring time, keeping the advantages offered by the RTC approach and including a parasitic capacitance estimation feature. Particularly, an effective architecture, based on moving thresholds, has been proposed, simulated, and experimentally tested with commercial resistors (values between 1 MOhm and 100 GOhm) and capacitors (values between 1 and 47 pF). Finally, a fast sensor transient, due to a rapid change in the heating power, has been acquired with the proposed instrument and compared with a similar transient analyzed with a classical RTC approach. This test has shown the applicability of the interface for solutions requiring detailed information of the sensor response, such as the characterization of new sensors (e.g., nanowires) or the behavior analysis during nonstandard thermal profiles.

A New and Fast-Readout Interface for Resistive Chemical Sensors

DEPARI, Alessandro;FLAMMINI, Alessandra;MARIOLI, Daniele;SISINNI, Emiliano;
2010-01-01

Abstract

The main issue concerning metal oxide (MOX) gas sensors is mostly related to the wide range of resistive values that the sensors can show. In addition, some sensors could have baseline resistive values up to tens of gigohms. To avoid the use of expensive picoammeters or the use of circuits adopting scaling factors, different solutions have recently been proposed, exploiting the resistance-to-time conversion (RTC) technique. They show good linearity and are suitable for the integration in a chip together with the elaboration unit, but they may require long measurement time (tens of seconds) if high resistance values need to be estimated. In addition, they may suffer the influence of a sensor parasitic capacitance, in parallel with the resistive component. In this paper, a new method is proposed to reduce the measuring time, keeping the advantages offered by the RTC approach and including a parasitic capacitance estimation feature. Particularly, an effective architecture, based on moving thresholds, has been proposed, simulated, and experimentally tested with commercial resistors (values between 1 MOhm and 100 GOhm) and capacitors (values between 1 and 47 pF). Finally, a fast sensor transient, due to a rapid change in the heating power, has been acquired with the proposed instrument and compared with a similar transient analyzed with a classical RTC approach. This test has shown the applicability of the interface for solutions requiring detailed information of the sensor response, such as the characterization of new sensors (e.g., nanowires) or the behavior analysis during nonstandard thermal profiles.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11379/33407
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