Residual stresses are one of the important feature determining the performance of structural as well as functional materials. Since residual stresses are difficult to be predicted they must be reliably measured. X-Ray microdiffraction laboratory systems equipped with 2D detectors allow to evaluate them with a very high spatial resolution. In this work a new method to evaluate residual stresses based on the analysis of a single Debye ring is proposed. This method is particularly suitable for the stress analysis of coatings and for sample with complex geometry. Examples are discussed and the results compared with those obtained by the conventional d-sin2psi method.

X-ray Diffraction Debye Ring Analysis for Stress Measurement (DRAST) : a new method to evaluate residual stresses

GELFI, Marcello;BONTEMPI, Elza;ROBERTI, Roberto;DEPERO, Laura Eleonora
2004-01-01

Abstract

Residual stresses are one of the important feature determining the performance of structural as well as functional materials. Since residual stresses are difficult to be predicted they must be reliably measured. X-Ray microdiffraction laboratory systems equipped with 2D detectors allow to evaluate them with a very high spatial resolution. In this work a new method to evaluate residual stresses based on the analysis of a single Debye ring is proposed. This method is particularly suitable for the stress analysis of coatings and for sample with complex geometry. Examples are discussed and the results compared with those obtained by the conventional d-sin2psi method.
File in questo prodotto:
File Dimensione Formato  
Acta_materialia_2004.pdf

gestori archivio

Tipologia: Full Text
Licenza: DRM non definito
Dimensione 321.57 kB
Formato Adobe PDF
321.57 kB Adobe PDF   Visualizza/Apri   Richiedi una copia

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11379/28750
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 83
  • ???jsp.display-item.citation.isi??? 71
social impact