The magnetic profile across the interface of a perpendicular exchange coupled [NiO=CoO]3/Pt-Co/Pt(111) system is investigated. The magneto-optic Kerr effect reveals a strong coupling between the antiferromagnetic (AFM) oxide and the ferromagnetic (FM) Pt-Co layer, by an increasing coercivity and a rotation of the easy magnetization axis of the FM layer along the AFM spins. Soft x-ray resonant magnetic reflectivity is used to probe the spatial distribution of the out-of-plane magnetization inside the oxide above its ordering temperature. It extends over 1 nm and exhibits a change of sign.
Depth magnetization profile of a perpendicular exchange coupled system by soft-x-ray resonant magnetic reflectivity
BONTEMPI, Elza;
2008-01-01
Abstract
The magnetic profile across the interface of a perpendicular exchange coupled [NiO=CoO]3/Pt-Co/Pt(111) system is investigated. The magneto-optic Kerr effect reveals a strong coupling between the antiferromagnetic (AFM) oxide and the ferromagnetic (FM) Pt-Co layer, by an increasing coercivity and a rotation of the easy magnetization axis of the FM layer along the AFM spins. Soft x-ray resonant magnetic reflectivity is used to probe the spatial distribution of the out-of-plane magnetization inside the oxide above its ordering temperature. It extends over 1 nm and exhibits a change of sign.File in questo prodotto:
| File | Dimensione | Formato | |
|---|---|---|---|
|
1.pdf
gestori archivio
Tipologia:
Documento in Post-print
Licenza:
DRM non definito
Dimensione
403.77 kB
Formato
Adobe PDF
|
403.77 kB | Adobe PDF | Visualizza/Apri Richiedi una copia |
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
