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X-ray diffraction and modelling studies of multilayer SnO2 thin film gas sensors
1996-01-01 Depero, Laura Eleonora; Perego, C.; Sangaletti, L.; Sberveglieri, Giorgio
X-ray Diffraction Debye Ring Analysis for Stress Measurement (DRAST) : a new method to evaluate residual stresses
2004-01-01 Gelfi, Marcello; Bontempi, Elza; Roberti, Roberto; Depero, Laura Eleonora
X-ray photoelectron study of the relaxor lead magnesium niobate
1996-01-01 Parmigiani, Fulvio; Rollandi, Loredana; Samoggia, Giorgio; Depero, Laura Eleonora
X-ray reflectivity and glancing incidence diffraction from thin metallic Cr layers
2000-01-01 Bontempi, Elza; Depero, Laura Eleonora; Sangaletti, Luigi Ermenegildo
X-ray reflectivity and total reflection x-ray fluorescence study of surface oxide evolution in a GaAs/AlAs multilayer system
2009-01-01 Colombi, Paolo; Bontempi, Elza; Depero, Laura Eleonora; Azuma, Y; Fujimoto, T.
X-ray reflectivity spectra of ultrathin films and nanometric multilayers: Experiment and simulation
2001-01-01 Bontempi, Elza; Depero, Laura Eleonora; Sangaletti, L; Giorgis, F; Pirri, Cf
X-ray reflectivity study of the structural properties of SiO2 and SiOF thin films
2001-01-01 Ceriola, G.; Iacona, F.; LA VIA, F; Raineri, V; Bontempi, Elza; Depero, Laura Eleonora
XPS spectra and optical reflectivity of yttrium stabilized zirconia
1993-01-01 Camagni, P; Depero, Laura Eleonora; Parmigiani, F.; Samoggia, G.; Sangaletti, L.; Scagliotti, M.
Young modulus and Poisson ratio measurements of TiO2 thin films deposited with Atomic Layer Deposition
2012-01-01 Borgese, Laura; Gelfi, Marcello; Bontempi, Elza; P., Goudeau; G., Geandier; D., Thiaudière; Depero, Laura Eleonora
ZnO whiskers and belts in chestnut husk-like structures: Synthesis and proof of chemomechanical transduction
2009-01-01 Alessandri, Ivano; Bergese, Paolo; Depero, Laura Eleonora
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| X-ray diffraction and modelling studies of multilayer SnO2 thin film gas sensors | 1-gen-1996 | Depero, Laura Eleonora; Perego, C.; Sangaletti, L.; Sberveglieri, Giorgio | |
| X-ray Diffraction Debye Ring Analysis for Stress Measurement (DRAST) : a new method to evaluate residual stresses | 1-gen-2004 | Gelfi, Marcello; Bontempi, Elza; Roberti, Roberto; Depero, Laura Eleonora | |
| X-ray photoelectron study of the relaxor lead magnesium niobate | 1-gen-1996 | Parmigiani, Fulvio; Rollandi, Loredana; Samoggia, Giorgio; Depero, Laura Eleonora | |
| X-ray reflectivity and glancing incidence diffraction from thin metallic Cr layers | 1-gen-2000 | Bontempi, Elza; Depero, Laura Eleonora; Sangaletti, Luigi Ermenegildo | |
| X-ray reflectivity and total reflection x-ray fluorescence study of surface oxide evolution in a GaAs/AlAs multilayer system | 1-gen-2009 | Colombi, Paolo; Bontempi, Elza; Depero, Laura Eleonora; Azuma, Y; Fujimoto, T. | |
| X-ray reflectivity spectra of ultrathin films and nanometric multilayers: Experiment and simulation | 1-gen-2001 | Bontempi, Elza; Depero, Laura Eleonora; Sangaletti, L; Giorgis, F; Pirri, Cf | |
| X-ray reflectivity study of the structural properties of SiO2 and SiOF thin films | 1-gen-2001 | Ceriola, G.; Iacona, F.; LA VIA, F; Raineri, V; Bontempi, Elza; Depero, Laura Eleonora | |
| XPS spectra and optical reflectivity of yttrium stabilized zirconia | 1-gen-1993 | Camagni, P; Depero, Laura Eleonora; Parmigiani, F.; Samoggia, G.; Sangaletti, L.; Scagliotti, M. | |
| Young modulus and Poisson ratio measurements of TiO2 thin films deposited with Atomic Layer Deposition | 1-gen-2012 | Borgese, Laura; Gelfi, Marcello; Bontempi, Elza; P., Goudeau; G., Geandier; D., Thiaudière; Depero, Laura Eleonora | |
| ZnO whiskers and belts in chestnut husk-like structures: Synthesis and proof of chemomechanical transduction | 1-gen-2009 | Alessandri, Ivano; Bergese, Paolo; Depero, Laura Eleonora |
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Opzioni
Scopri
Tipologia
- 1 Contributo su Rivista 340
- 1 Contributo su Rivista::1.1 Arti... 340
Data di pubblicazione
- 2020 - 2024 40
- 2010 - 2019 98
- 2000 - 2009 124
- 1990 - 1999 75
- 1988 - 1989 3
Editore
- Elsevier BV:PO Box 211, 1000 AE A... 19
- Elsevier Applied Science:An Impri... 4
- Elsevier Science Limited:Oxford F... 4
- Materials Research Society:9800 M... 3
- American Chemical Society:1155 Si... 2
- American Institute of Physics:2 H... 2
- Inn. Tec. 2
- IOP Publishing Limited:Dirac Hous... 2
- Springer Verlag Germany:Tiergarte... 2
- -BLACKWELL PUBLISHING, 9600 GARSI... 1
Rivista
- JOURNAL OF SOLID STATE CHEMISTRY 14
- SENSORS AND ACTUATORS. B, CHEMICAL 14
- MATERIALS RESEARCH SOCIETY SYMPOS... 12
- JOURNAL OF MATERIALS RESEARCH 9
- MATERIALS 9
- APPLIED SCIENCES 8
- APPLIED SURFACE SCIENCE 8
- THIN SOLID FILMS 8
- SOLID STATE COMMUNICATIONS 7
- SPECTROCHIMICA ACTA, PART B: ATOM... 7
Keyword
- Condensed Matter Physics 14
- Materials Science (all) 13
- Electronic 11
- Optical and Magnetic Materials 11
- TXRF 10
- Circular economy 8
- Fly ash 8
- Analytical Chemistry 7
- Chemistry (all) 7
- Environmental Chemistry 6
Lingua
- eng 328
- ita 6
Accesso al fulltext
- no fulltext 283
- reserved 28
- open 16
- restricted 13