QUARANTELLI, Michele
 Distribuzione geografica
Continente #
NA - Nord America 434
AS - Asia 179
EU - Europa 142
SA - Sud America 18
AF - Africa 2
OC - Oceania 1
Totale 776
Nazione #
US - Stati Uniti d'America 430
CN - Cina 76
SG - Singapore 59
UA - Ucraina 46
DE - Germania 34
BR - Brasile 14
FI - Finlandia 14
GB - Regno Unito 12
HK - Hong Kong 12
IT - Italia 11
VN - Vietnam 11
TR - Turchia 9
RU - Federazione Russa 8
IE - Irlanda 7
IN - India 6
FR - Francia 5
CA - Canada 4
BD - Bangladesh 2
ES - Italia 2
AT - Austria 1
AU - Australia 1
BE - Belgio 1
CL - Cile 1
CO - Colombia 1
EC - Ecuador 1
KR - Corea 1
MA - Marocco 1
MU - Mauritius 1
PK - Pakistan 1
PL - Polonia 1
SA - Arabia Saudita 1
TW - Taiwan 1
VE - Venezuela 1
Totale 776
Città #
Fairfield 73
Ashburn 58
Woodbridge 35
Jacksonville 30
Cambridge 26
Singapore 25
Seattle 23
Houston 22
Beijing 19
Wilmington 18
Chandler 16
Dallas 15
Munich 14
Hong Kong 12
Princeton 12
Nanjing 11
New York 8
Dublin 7
Helsinki 7
Los Angeles 7
Ann Arbor 6
Hebei 6
Nanchang 6
Des Moines 5
Istanbul 5
Tianjin 5
Brescia 4
Dearborn 4
Hanoi 4
Moscow 4
Changsha 3
Hangzhou 3
Ho Chi Minh City 3
London 3
Montreal 3
Orem 3
São Paulo 3
Buffalo 2
Chicago 2
Chiswick 2
Denver 2
Milan 2
San Diego 2
San Francisco 2
Shanghai 2
Shenyang 2
Taizhou 2
The Dalles 2
Verona 2
Washington 2
Angra dos Reis 1
Ankara 1
Atlanta 1
Barra dos Coqueiros 1
Blumenau 1
Boardman 1
Bogotá 1
Bologna 1
Boston 1
Brooklyn 1
Brussels 1
Calcinate 1
Campo Grande 1
Charlotte 1
Conceição de Macabu 1
Couto de Magalhães de Minas 1
Duncan 1
Faizabad 1
Fes 1
Fuzhou 1
Guayaquil 1
Hanover 1
Hefei 1
Huntsville 1
Iapu 1
Jinan 1
Kilburn 1
Kocaeli 1
Kunming 1
La Guaira 1
Lucknow 1
Mamak 1
Medina 1
Ninh Bình 1
Paris 1
Phoenix 1
Queens 1
Quận Một 1
Rawalpindi 1
Redondo Beach 1
Rochdale 1
Rondonópolis 1
Salt Lake City 1
Salvador 1
Sanliurfa 1
Santiago 1
Secaucus 1
Southwark 1
Sydney 1
Taipei 1
Totale 584
Nome #
A Fully-Integrated Inductor-Based 1.8-6V Step-up Converter 152
Automatic Scaling Procedures for Analog Design Reuse 140
Scaling Rules and Parameter Tuning Procedure for Analog Design Reuse in Technology Migration 134
Robust design of low EMI susceptibility CMOS OpAmp 132
High EMI Immunity CMOS OpAmp: Design and Measurements 113
Design of an integrated CMOS operational amplifier with low probability EMI induced failures 84
Layout experiments and test structures to characterize Local Layout Effects due to mechanical stress in FinFET transistors 32
Totale 787
Categoria #
all - tutte 3.772
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 3.772


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/202158 0 0 0 0 0 11 2 13 13 8 7 4
2021/202243 0 13 0 0 0 2 4 0 3 4 5 12
2022/202348 6 1 0 5 3 14 0 8 10 0 1 0
2023/202462 3 2 9 7 6 20 3 4 1 1 0 6
2024/2025101 0 1 0 15 15 5 13 1 17 0 22 12
2025/2026147 37 19 23 32 21 15 0 0 0 0 0 0
Totale 787