QUARANTELLI, Michele
QUARANTELLI, Michele
Dipartimento di Ingegneria dell'Informazione
A Fully-Integrated Inductor-Based 1.8-6V Step-up Converter
2004-01-01 Richelli, Anna; Colalongo, Luigi; Quarantelli, Michele; M., Carmina; KOVACS VAJNA, Zsolt Miklos
Automatic Scaling Procedures for Analog Design Reuse
2006-01-01 Savio, Alessandro; Colalongo, Luigi; Quarantelli, Michele; KOVACS VAJNA, Zsolt Miklos
Design of an integrated CMOS operational amplifier with low probability EMI induced failures
2001-01-01 Richelli, Anna; Colalongo, Luigi; Quarantelli, Michele; KOVACS VAJNA, Zsolt Miklos
High EMI Immunity CMOS OpAmp: Design and Measurements
2003-01-01 Richelli, Anna; Colalongo, Luigi; Quarantelli, Michele; KOVACS VAJNA, Zsolt Miklos
Layout experiments and test structures to characterize Local Layout Effects due to mechanical stress in FinFET transistors
2025-01-01 Rossoni, A.; Brozek, T.; Saxena, S.; Khamankar, R.; Hess, C.; Huang, J.; Teng, Y.; Kovacs-Vajna, Z.; Quarantelli, M.
Robust design of low EMI susceptibility CMOS OpAmp
2004-01-01 Richelli, Anna; Colalongo, Luigi; Quarantelli, Michele; KOVACS VAJNA, Zsolt Miklos
Scaling Rules and Parameter Tuning Procedure for Analog Design Reuse in Technology Migration
2004-01-01 Savio, Alessandro; Colalongo, Luigi; Quarantelli, Michele; KOVACS VAJNA, Zsolt Miklos
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| A Fully-Integrated Inductor-Based 1.8-6V Step-up Converter | 1-gen-2004 | Richelli, Anna; Colalongo, Luigi; Quarantelli, Michele; M., Carmina; KOVACS VAJNA, Zsolt Miklos | |
| Automatic Scaling Procedures for Analog Design Reuse | 1-gen-2006 | Savio, Alessandro; Colalongo, Luigi; Quarantelli, Michele; KOVACS VAJNA, Zsolt Miklos | |
| Design of an integrated CMOS operational amplifier with low probability EMI induced failures | 1-gen-2001 | Richelli, Anna; Colalongo, Luigi; Quarantelli, Michele; KOVACS VAJNA, Zsolt Miklos | |
| High EMI Immunity CMOS OpAmp: Design and Measurements | 1-gen-2003 | Richelli, Anna; Colalongo, Luigi; Quarantelli, Michele; KOVACS VAJNA, Zsolt Miklos | |
| Layout experiments and test structures to characterize Local Layout Effects due to mechanical stress in FinFET transistors | 1-gen-2025 | Rossoni, A.; Brozek, T.; Saxena, S.; Khamankar, R.; Hess, C.; Huang, J.; Teng, Y.; Kovacs-Vajna, Z.; Quarantelli, M. | |
| Robust design of low EMI susceptibility CMOS OpAmp | 1-gen-2004 | Richelli, Anna; Colalongo, Luigi; Quarantelli, Michele; KOVACS VAJNA, Zsolt Miklos | |
| Scaling Rules and Parameter Tuning Procedure for Analog Design Reuse in Technology Migration | 1-gen-2004 | Savio, Alessandro; Colalongo, Luigi; Quarantelli, Michele; KOVACS VAJNA, Zsolt Miklos |