Spectrochimica Acta Part B Virtual Special Issue on the 17th International Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods

This Virtual Special Issue (VSI) provides an overview of the most novel and original research presented during the 17th International Conference on Total Reflection X-Ray Fluorescence Analysis and Related Methods (TXRF 2017). The TXRF 2017was held on September 19–22, 2017 in Brescia, Italy. The aimof the conferencewas to bring together experts, users andmanufacturers of total reflection X-ray fluorescence (TXRF) spectrometers to present and discuss recent advances, research results and perspectives. Emphasis is given to potential applications of TXRF and related methods for trace and ultra-trace analysis in environmental, semiconductor, nanomaterials, food, cosmetics, fuels, energy and archaeometry, biology, synchrotron radiation, instrument and modelling fields. TXRF2017 was an important and effective opportunity for substantial discussions, exchange of knowledge and experience. A total of 89 participants from 22 countries attended TXRF 2017, including 4 plenary lectures, 16 invited speakers, 54 oral presentations and 49 poster presentations.