SANGALETTI, Luigi Ermenegildo

SANGALETTI, Luigi Ermenegildo  

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Risultati 1 - 11 di 11 (tempo di esecuzione: 0.018 secondi).
Titolo Data di pubblicazione Autore(i) File
A new modeling approach to superconductor layered structures 1-gen-1999 Depero, Laura Eleonora; Sangaletti, Luigi Ermenegildo; Allieri, Brigida; Bontempi, Elza
Diffraction determination of stress field and elastic constants in polycrystalline materials 1-gen-1997 Freri, N.; Tintori, A.; Depero, Laura Eleonora; Sangaletti, Luigi Ermenegildo; Cernuschi, F. GHIA S.
Disorder and bond hybridization in boron nitride thin films 1-gen-1996 Depero, Laura Eleonora; Sangaletti, Luigi Ermenegildo; Schaffnit, C.; Rossi, F; Gipson, Pn
Growth and microstructural analysis of nanosized Y2O3 doped with rare-earths 1-gen-2000 Allieri, Brigida; Depero, Laura Eleonora; Marino, A; Sangaletti, Luigi Ermenegildo; Caporaso, L; Speghini, A; Bettinelli, M.
Growth process analysis of a-Si1-xNx:H films probed by X-ray reflectivity 1-gen-2000 Bontempi, Elza; Depero, Laura Eleonora; Sangaletti, Luigi Ermenegildo; F., Giorgis; C. F., Pirri
Influence of the completion of oxidation on the long-term response of RGTO SnO2 gas sensors 1-gen-2000 Dieguez, A; Romanorodriguez, A; Morante, Jr; Sangaletti, Luigi Ermenegildo; Depero, Laura Eleonora; Comini, Elisabetta; Faglia, Guido; Sberveglieri, Giorgio
Microanalytical study of Er-doped LiNbO3 crystals obtained by Er-Li ion exchange 1-gen-2001 Caccavale, F; Sada, C; Segato, F; Allieri, Brigida; Depero, Laura Eleonora; Sangaletti, Luigi Ermenegildo; Fedorov, Va; Korkishko, Yn
Morphology and microstructural properties of TiO2 nanopowders doped with trivalent Al and Ga cations 1-gen-2000 Depero, Laura Eleonora; A., Marino; Allieri, Brigida; Bontempi, Elza; Sangaletti, Luigi Ermenegildo; C., Casale; M., Notaro
Structural disorder in CdSxSe1-x films probed by microdiffraction experiments 1-gen-2002 Pagliara, Stefania; Sangaletti, Luigi Ermenegildo; Depero, Laura Eleonora; Capozzi, V; Perna, G.
Structural modeling in the MoBiO system 1-gen-1995 Depero, Laura Eleonora; Sangaletti, Luigi Ermenegildo
X-ray reflectivity and glancing incidence diffraction from thin metallic Cr layers 1-gen-2000 Bontempi, Elza; Depero, Laura Eleonora; Sangaletti, Luigi Ermenegildo