SANGALETTI, Luigi Ermenegildo
SANGALETTI, Luigi Ermenegildo
A new modeling approach to superconductor layered structures
1999-01-01 Depero, Laura Eleonora; Sangaletti, Luigi Ermenegildo; Allieri, Brigida; Bontempi, Elza
Diffraction determination of stress field and elastic constants in polycrystalline materials
1997-01-01 Freri, N.; Tintori, A.; Depero, Laura Eleonora; Sangaletti, Luigi Ermenegildo; Cernuschi, F. GHIA S.
Disorder and bond hybridization in boron nitride thin films
1996-01-01 Depero, Laura Eleonora; Sangaletti, Luigi Ermenegildo; Schaffnit, C.; Rossi, F; Gipson, Pn
Growth and microstructural analysis of nanosized Y2O3 doped with rare-earths
2000-01-01 Allieri, Brigida; Depero, Laura Eleonora; Marino, A; Sangaletti, Luigi Ermenegildo; Caporaso, L; Speghini, A; Bettinelli, M.
Growth process analysis of a-Si1-xNx:H films probed by X-ray reflectivity
2000-01-01 Bontempi, Elza; Depero, Laura Eleonora; Sangaletti, Luigi Ermenegildo; F., Giorgis; C. F., Pirri
Influence of the completion of oxidation on the long-term response of RGTO SnO2 gas sensors
2000-01-01 Dieguez, A; Romanorodriguez, A; Morante, Jr; Sangaletti, Luigi Ermenegildo; Depero, Laura Eleonora; Comini, Elisabetta; Faglia, Guido; Sberveglieri, Giorgio
Microanalytical study of Er-doped LiNbO3 crystals obtained by Er-Li ion exchange
2001-01-01 Caccavale, F; Sada, C; Segato, F; Allieri, Brigida; Depero, Laura Eleonora; Sangaletti, Luigi Ermenegildo; Fedorov, Va; Korkishko, Yn
Morphology and microstructural properties of TiO2 nanopowders doped with trivalent Al and Ga cations
2000-01-01 Depero, Laura Eleonora; A., Marino; Allieri, Brigida; Bontempi, Elza; Sangaletti, Luigi Ermenegildo; C., Casale; M., Notaro
Structural disorder in CdSxSe1-x films probed by microdiffraction experiments
2002-01-01 Pagliara, Stefania; Sangaletti, Luigi Ermenegildo; Depero, Laura Eleonora; Capozzi, V; Perna, G.
Structural modeling in the MoBiO system
1995-01-01 Depero, Laura Eleonora; Sangaletti, Luigi Ermenegildo
X-ray reflectivity and glancing incidence diffraction from thin metallic Cr layers
2000-01-01 Bontempi, Elza; Depero, Laura Eleonora; Sangaletti, Luigi Ermenegildo
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| A new modeling approach to superconductor layered structures | 1-gen-1999 | Depero, Laura Eleonora; Sangaletti, Luigi Ermenegildo; Allieri, Brigida; Bontempi, Elza | |
| Diffraction determination of stress field and elastic constants in polycrystalline materials | 1-gen-1997 | Freri, N.; Tintori, A.; Depero, Laura Eleonora; Sangaletti, Luigi Ermenegildo; Cernuschi, F. GHIA S. | |
| Disorder and bond hybridization in boron nitride thin films | 1-gen-1996 | Depero, Laura Eleonora; Sangaletti, Luigi Ermenegildo; Schaffnit, C.; Rossi, F; Gipson, Pn | |
| Growth and microstructural analysis of nanosized Y2O3 doped with rare-earths | 1-gen-2000 | Allieri, Brigida; Depero, Laura Eleonora; Marino, A; Sangaletti, Luigi Ermenegildo; Caporaso, L; Speghini, A; Bettinelli, M. | |
| Growth process analysis of a-Si1-xNx:H films probed by X-ray reflectivity | 1-gen-2000 | Bontempi, Elza; Depero, Laura Eleonora; Sangaletti, Luigi Ermenegildo; F., Giorgis; C. F., Pirri | |
| Influence of the completion of oxidation on the long-term response of RGTO SnO2 gas sensors | 1-gen-2000 | Dieguez, A; Romanorodriguez, A; Morante, Jr; Sangaletti, Luigi Ermenegildo; Depero, Laura Eleonora; Comini, Elisabetta; Faglia, Guido; Sberveglieri, Giorgio | |
| Microanalytical study of Er-doped LiNbO3 crystals obtained by Er-Li ion exchange | 1-gen-2001 | Caccavale, F; Sada, C; Segato, F; Allieri, Brigida; Depero, Laura Eleonora; Sangaletti, Luigi Ermenegildo; Fedorov, Va; Korkishko, Yn | |
| Morphology and microstructural properties of TiO2 nanopowders doped with trivalent Al and Ga cations | 1-gen-2000 | Depero, Laura Eleonora; A., Marino; Allieri, Brigida; Bontempi, Elza; Sangaletti, Luigi Ermenegildo; C., Casale; M., Notaro | |
| Structural disorder in CdSxSe1-x films probed by microdiffraction experiments | 1-gen-2002 | Pagliara, Stefania; Sangaletti, Luigi Ermenegildo; Depero, Laura Eleonora; Capozzi, V; Perna, G. | |
| Structural modeling in the MoBiO system | 1-gen-1995 | Depero, Laura Eleonora; Sangaletti, Luigi Ermenegildo | |
| X-ray reflectivity and glancing incidence diffraction from thin metallic Cr layers | 1-gen-2000 | Bontempi, Elza; Depero, Laura Eleonora; Sangaletti, Luigi Ermenegildo |