ZANOLA, Paolo
 Distribuzione geografica
Continente #
NA - Nord America 701
EU - Europa 274
AS - Asia 158
AF - Africa 2
Continente sconosciuto - Info sul continente non disponibili 1
SA - Sud America 1
Totale 1.137
Nazione #
US - Stati Uniti d'America 697
CN - Cina 88
DE - Germania 83
UA - Ucraina 74
GB - Regno Unito 46
SG - Singapore 26
FI - Finlandia 23
HK - Hong Kong 23
IT - Italia 16
IE - Irlanda 11
RU - Federazione Russa 11
TR - Turchia 11
IN - India 8
CA - Canada 4
FR - Francia 3
MU - Mauritius 2
RO - Romania 2
BE - Belgio 1
BG - Bulgaria 1
BR - Brasile 1
EU - Europa 1
IQ - Iraq 1
LT - Lituania 1
NL - Olanda 1
SE - Svezia 1
TH - Thailandia 1
Totale 1.137
Città #
Fairfield 97
Houston 90
Woodbridge 84
Ashburn 61
Jacksonville 54
Seattle 45
Wilmington 45
Cambridge 44
Nanjing 35
Ann Arbor 32
Lancaster 27
Hong Kong 22
Princeton 21
Chandler 20
Singapore 20
Beijing 13
Helsinki 12
Dublin 11
Istanbul 10
New York 9
Brescia 7
Nanchang 6
Shenyang 6
Des Moines 5
Jinan 5
Dearborn 4
Hebei 4
Milan 3
Taizhou 3
Tianjin 3
Washington 3
Frankfurt am Main 2
Hangzhou 2
Jiaxing 2
Lanzhou 2
Los Angeles 2
Nürnberg 2
Ottawa 2
San Diego 2
San Mateo 2
Shanghai 2
Toronto 2
Acton 1
Arbil 1
Brussels 1
Changchun 1
Changsha 1
Falkenstein 1
Gunzenhausen 1
Hounslow 1
Kilburn 1
Kocaeli 1
Kwai Chung 1
London 1
Marche 1
Monmouth Junction 1
Munich 1
Ningbo 1
Oklahoma City 1
Prescot 1
San Francisco 1
Shaoxing 1
Sofia 1
Southwark 1
São Paulo 1
Verona 1
Vittoria 1
Volgograd 1
Zhengzhou 1
Totale 850
Nome #
Laboratory microbeam analysis applied to cultural heritage studies 150
Glancing-incidence X-ray diffraction for depth profiling of polycrystalline layers 121
Residual stress measurement of gold artefacts by Debye ring analysis 116
IN SITU XRD CHARACTERIZATION OF HYDROGEN DESORPTION FROM ELECTROCHEMICALLY DEPOSITED PD COATING 112
Structural and microstructural characterisation of ZrN coatings for decorative applications 111
Modeling of glancing incidence X-ray for depth profiling of thin layers 109
Elastic behaviour of titanium dioxide films on polyimide substrates studied by in situ tensile testing in a X-ray diffractometer 102
Structural characterization of nanocrystalline lanthanum oxyfluoride films obtained by chemical vapor deposition 98
New Potential Testing Methods for Advancing Characterization of Jewellery 96
Characterization of silicon carbide thin films grown on Si and SiO2/Si substrates 86
In situ X-ray diffraction study of tarnishing process of Ag and Ag-alloys 65
Totale 1.166
Categoria #
all - tutte 5.054
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 5.054


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/2020212 0 0 0 0 20 34 33 35 26 41 6 17
2020/2021150 3 19 3 18 6 15 6 21 25 11 18 5
2021/202295 1 26 1 0 0 0 8 2 7 13 5 32
2022/202381 10 1 5 0 5 19 0 9 21 0 4 7
2023/202492 8 1 12 3 7 18 5 1 23 2 0 12
2024/202551 0 0 3 27 21 0 0 0 0 0 0 0
Totale 1.166