Sfoglia per Autore ZANOLA, Paolo
New Potential Testing Methods for Advancing Characterization of Jewellery
2004-01-01 Alessandri, Ivano; Bontempi, Elza; Colombi, Paolo; Depero, Laura Eleonora; Gelfi, Marcello; Panvini, Andrea; Roberti, Roberto; Zanola, Paolo
Characterization of silicon carbide thin films grown on Si and SiO2/Si substrates
2004-01-01 Zanola, Paolo; Bontempi, Elza; C., Ricciardi; G., Barucca; Depero, Laura Eleonora
In situ X-ray diffraction study of tarnishing process of Ag and Ag-alloys
2005-01-01 Roberti, Roberto; Bontempi, Elza; Depero, Laura Eleonora; Gelfi, Marcello; Zanola, Paolo
Residual stress measurement of gold artefacts by Debye ring analysis
2006-01-01 Zanola, Paolo; Benedetti, Dario Paolo; Bontempi, Elza; Villa, Valerio; Baronio, Gabriele; Tosti, M; Roberti, Roberto; Depero, Laura Eleonora
Structural and microstructural characterisation of ZrN coatings for decorative applications
2006-01-01 Zanola, Paolo; Bontempi, Elza; Gelfi, Marcello; M., Tosti; Roberti, Roberto; Depero, Laura Eleonora
Laboratory microbeam analysis applied to cultural heritage studies
2006-01-01 Benedetti, Dario Paolo; Alessandri, Ivano; Bergese, Paolo; Bontempi, Elza; Colombi, Paolo; Garipoli, Donatella; Pedrazzani, Roberta; Zanola, Paolo; Depero, Laura Eleonora
Glancing-incidence X-ray diffraction for depth profiling of polycrystalline layers
2006-01-01 Colombi, Paolo; Zanola, Paolo; Bontempi, Elza; Roberti, Roberto; Gelfi, Marcello; Depero, Laura Eleonora
Structural characterization of nanocrystalline lanthanum oxyfluoride films obtained by chemical vapor deposition
2007-01-01 Barreca, D; Bontempi, Elza; Depero, Laura Eleonora; Maragno, C; Tondello, E; Zanola, Paolo
Modeling of glancing incidence X-ray for depth profiling of thin layers
2007-01-01 Colombi, Paolo; Zanola, Paolo; Bontempi, Elza; Depero, Laura Eleonora
IN SITU XRD CHARACTERIZATION OF HYDROGEN DESORPTION FROM ELECTROCHEMICALLY DEPOSITED PD COATING
2010-01-01 Borgese, Laura; Zanola, Paolo; Bontempi, Elza; D., Rossi; Depero, Laura Eleonora
Elastic behaviour of titanium dioxide films on polyimide substrates studied by in situ tensile testing in a X-ray diffractometer
2010-01-01 Bontempi, Elza; Zanola, Paolo; Gelfi, Marcello; Zucca, Marcello; Depero, Laura Eleonora; Baptiste, Girault; Philippe, Goudeau; Guillaume, Geandier; ERIC LE, Bourhis; PIERRE OLIVIER, Renault
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| New Potential Testing Methods for Advancing Characterization of Jewellery | 1-gen-2004 | Alessandri, Ivano; Bontempi, Elza; Colombi, Paolo; Depero, Laura Eleonora; Gelfi, Marcello; Panvini, Andrea; Roberti, Roberto; Zanola, Paolo | |
| Characterization of silicon carbide thin films grown on Si and SiO2/Si substrates | 1-gen-2004 | Zanola, Paolo; Bontempi, Elza; C., Ricciardi; G., Barucca; Depero, Laura Eleonora | |
| In situ X-ray diffraction study of tarnishing process of Ag and Ag-alloys | 1-gen-2005 | Roberti, Roberto; Bontempi, Elza; Depero, Laura Eleonora; Gelfi, Marcello; Zanola, Paolo | |
| Residual stress measurement of gold artefacts by Debye ring analysis | 1-gen-2006 | Zanola, Paolo; Benedetti, Dario Paolo; Bontempi, Elza; Villa, Valerio; Baronio, Gabriele; Tosti, M; Roberti, Roberto; Depero, Laura Eleonora | |
| Structural and microstructural characterisation of ZrN coatings for decorative applications | 1-gen-2006 | Zanola, Paolo; Bontempi, Elza; Gelfi, Marcello; M., Tosti; Roberti, Roberto; Depero, Laura Eleonora | |
| Laboratory microbeam analysis applied to cultural heritage studies | 1-gen-2006 | Benedetti, Dario Paolo; Alessandri, Ivano; Bergese, Paolo; Bontempi, Elza; Colombi, Paolo; Garipoli, Donatella; Pedrazzani, Roberta; Zanola, Paolo; Depero, Laura Eleonora | |
| Glancing-incidence X-ray diffraction for depth profiling of polycrystalline layers | 1-gen-2006 | Colombi, Paolo; Zanola, Paolo; Bontempi, Elza; Roberti, Roberto; Gelfi, Marcello; Depero, Laura Eleonora | |
| Structural characterization of nanocrystalline lanthanum oxyfluoride films obtained by chemical vapor deposition | 1-gen-2007 | Barreca, D; Bontempi, Elza; Depero, Laura Eleonora; Maragno, C; Tondello, E; Zanola, Paolo | |
| Modeling of glancing incidence X-ray for depth profiling of thin layers | 1-gen-2007 | Colombi, Paolo; Zanola, Paolo; Bontempi, Elza; Depero, Laura Eleonora | |
| IN SITU XRD CHARACTERIZATION OF HYDROGEN DESORPTION FROM ELECTROCHEMICALLY DEPOSITED PD COATING | 1-gen-2010 | Borgese, Laura; Zanola, Paolo; Bontempi, Elza; D., Rossi; Depero, Laura Eleonora | |
| Elastic behaviour of titanium dioxide films on polyimide substrates studied by in situ tensile testing in a X-ray diffractometer | 1-gen-2010 | Bontempi, Elza; Zanola, Paolo; Gelfi, Marcello; Zucca, Marcello; Depero, Laura Eleonora; Baptiste, Girault; Philippe, Goudeau; Guillaume, Geandier; ERIC LE, Bourhis; PIERRE OLIVIER, Renault |
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